Published February 1986 | Version v1
Journal article

Reliability studies of planar silicon detectors

  • 1. CERN, European Organization for Nuclear Res., 1211 Geneva 23

Description

For future large scale, long term applications of silicon particle detectors in high energy physics experiments, e.g. in proton or electron colliders, it is necessary to evaluate the reliability of such detectors. An automated measurement apparatus has been built, which is used to test planar silicon detectors for several days or weeks, both with and without irradiation. Defective detectors were studied with SEM and EBIC microscopy. Special test structures were designed to evaluate and possibly improve detector characteristics

Additional details

Publishing Information

Journal Title
IEEE Trans. Nucl. Sci.
Journal Volume
NS-33
Journal Issue
1
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
vp.
ISSN
0018-9499
CODEN
IETNA

Conference

Title
IEEE nuclear science symposium.
Dates
23-25 Oct 1985.
Place
San Francisco, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17083424
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
IRRADIATION; PHYSICAL RADIATION EFFECTS; RELIABILITY; SCANNING ELECTRON MICROSCOPY; SI SEMICONDUCTOR DETECTORS; STORAGE RINGS; TESTING
Descriptors DEC
ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS

Optional Information

Secondary number(s)
CONF-851009--.