Published February 1986
| Version v1
Journal article
Reliability studies of planar silicon detectors
- 1. CERN, European Organization for Nuclear Res., 1211 Geneva 23
Description
For future large scale, long term applications of silicon particle detectors in high energy physics experiments, e.g. in proton or electron colliders, it is necessary to evaluate the reliability of such detectors. An automated measurement apparatus has been built, which is used to test planar silicon detectors for several days or weeks, both with and without irradiation. Defective detectors were studied with SEM and EBIC microscopy. Special test structures were designed to evaluate and possibly improve detector characteristics
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-33
- Journal Issue
- 1
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- vp.
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- IEEE nuclear science symposium.
- Dates
- 23-25 Oct 1985.
- Place
- San Francisco, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17083424
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IRRADIATION; PHYSICAL RADIATION EFFECTS; RELIABILITY; SCANNING ELECTRON MICROSCOPY; SI SEMICONDUCTOR DETECTORS; STORAGE RINGS; TESTING
- Descriptors DEC
- ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS
Optional Information
- Secondary number(s)
- CONF-851009--.