Estimation of electron-loss and photon-scattering corrections for parallel-plate free-air chambers
Creators
- 1. National Inst. of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Ibaraki (Japan)
Description
Parallel-plate free-air ionization chambers are used for X-ray air-kerma rate standards at the National Metrology Institute of Japan (NMIJ), AIST. The electron-loss and photon-scattering correction factors are needed for the evaluation of air-kerma rate from measured current. The electron-loss correction factor (Ke) is a correction of the charge loss by giving energy to the electrode part without the high-speed electron stopping in the air area where the charges are collected. The scattering correction factor (Ksc) is for a correction of extra charges produced by scattered photons generated after an incidence photon is interactive. The electron-loss and photon-scattering correction factors for 3 different size parallel-plate free-air chambers are estimated by the EGS4 code. One chamber is used to get primary standards for absolute measurements of air kerma in beams of medium-energy X-rays and the other two are used for the same purpose in beams of low-energy X-rays. These correction factors are calculated for mono-energetic photons. It is found that electron-loss and photon-scattering correction factors depend on the chamber size, and the latter especially changes greatly depending on the size. The Ke and Ksc value for medium- and low-energy X-ray fields at AIST are estimated by averaging the energy deposition contributions over the X-ray spectrum. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nuclear Science and Technology (Tokyo)
- Journal Volume
- 42
- Journal Issue
- 12
- Journal Page Range
- p. 1077-1080
- ISSN
- 0022-3131
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53076722
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AIR; CALIBRATION STANDARDS; CORRECTIONS; DOSE RATEMETERS; ELECTRON LOSS; IONIZATION CHAMBERS; KERMA; MONTE CARLO METHOD; PHOTONS; SCATTERING; X-RAY DOSIMETRY
- Descriptors DEC
- BOSONS; CALCULATION METHODS; DOSIMETRY; ELEMENTARY PARTICLES; FLUIDS; GASES; MASSLESS PARTICLES; MEASURING INSTRUMENTS; RADIATION DETECTORS; STANDARDS
Optional Information
- Notes
- 3 refs., 6 figs., 6 tabs.; This record replaces 37041284