Published June 1971
| Version v1
Journal article
Work function of tantalum carbide and the effects of adsorption and sputtering of cesium
Description
The work function of ``unactivated'' tantalum carbide is 4.22±0.06 eV. The decrease of work function produced by the so-called ``activation'' process is attributed to a loss of carbon. The deposition of low-energy cesium ions (2–5 eV) reduced the work function to a minimum value of 1.40±0.02 eV. Cesium ions with energies of 7–28 eV sputter previously adsorbed cesium in the form of neutral atoms. The energy required to produce this sputtering decreases with increasing cesium coverage.
Additional details
Identifiers
- DOI
- 10.1063/1.1660608;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 42
- Journal Issue
- 7
- Series
- J. Appl. Phys.
- Journal Page Range
- 2682-2688
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 3014807
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ADSORPTION; CESIUM; ENERGY; IONS; SPUTTERING; TANTALUM CARBIDES; WORK FUNCTIONS
- Descriptors DEC
- THERMIONICS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent