Published May 1989
| Version v1
Journal article
Trace element analyses of spectroscopically pure silicon dioxide by instrumental neutron activation analysis
Creators
- 1. Massachusetts Inst. of Tech., Cambridge, MA (USA). Dept. of Earth, Atmospheric and Planetary Sciences
Description
Spectroscopically pure, 99.999% silicon dioxide (SiO2) from five different companies was analyzed for trace element impurities by instrumental neutron activation analysis using semiconductor detectors and gamma-ray spectrometry. If large amounts of these purified SiO2 samples are added to geological samples with low trace element contents e.g., mineral separates such as quartz, feldspar and olivine, the trace element contents of the SiO2 are a significant contaminant. (author) 6 refs.; 3 tabs
Additional details
Additional titles
- Subtitle (English)
- Implications for the analysis of geologic materials
- Augmented title (English)
- Ce,Co,Cr,Cs,Eu,Hf,La,Lu,Na,Nd,Sb,Sc,Sm,Ta,Tb,Th,U,Yb
Publishing Information
- Journal Title
- Journal of Radioanalytical and Nuclear Chemistry
- Journal Volume
- 131
- Journal Issue
- 1
- Series
- J. Radioanal. Nucl. Chem. ;Articles.
- Journal Page Range
- 37-42
- ISSN
- 0236-5731
- CODEN
- JRNCD
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 21030322
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CALIBRATION STANDARDS; EXPERIMENTAL DATA; GAMMA SPECTROSCOPY; IMPURITIES; IRRADIATION PROCEDURES; MULTI-ELEMENT ANALYSIS; NEUTRON ACTIVATION ANALYSIS; SENSITIVITY; SILICATE MINERALS; SILICON OXIDES; SUBSTRATES; TRACE AMOUNTS
- Descriptors DEC
- ACTIVATION ANALYSIS; CHALCOGENIDES; CHEMICAL ANALYSIS; DATA; INFORMATION; MINERALS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY