Published August 2007 | Version v1
Journal article

Target thickness dependence of 50 keV electron bremsstrahlung

  • 1. Texas Christian University, Department of Physics and Astronomy, TCU Box 298840, Fort Worth, TX 76129 (United States)

Description

We are investigating the extent/existence of PB contributions to the X-ray spectra at 90 deg. to the electron beam for experiments involving 50 keV electrons on Au targets. Our experimental results, for a range of target thicknesses from 63 μg/cm2 to CSDA range of the electrons, are compared to results obtained using the Monte Carlo program, PENELOPE, which is based on ordinary bremsstrahlung. We have reduced the error in target thickness of previous cross section measurements by determining the average target thickness using X-ray absorption

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.03.052;
PII
S0168-583X(07)00666-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
261
Journal Issue
1-2
Journal Page Range
p. 184-188
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
19. International conference on the application of accelerators in research and industry
Dates
20-25 Aug 2006
Place
Fort Worth, TX (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39024998
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; BREMSSTRAHLUNG; CROSS SECTIONS; ELECTRON BEAMS; ELECTRONS; ERRORS; KEV RANGE 10-100; MONTE CARLO METHOD; THICKNESS; THIN FILMS; X RADIATION; X-RAY SPECTRA
Descriptors DEC
BEAMS; CALCULATION METHODS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; FILMS; IONIZING RADIATIONS; KEV RANGE; LEPTON BEAMS; LEPTONS; PARTICLE BEAMS; RADIATIONS; SORPTION; SPECTRA

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.