Published August 2007
| Version v1
Journal article
Target thickness dependence of 50 keV electron bremsstrahlung
- 1. Texas Christian University, Department of Physics and Astronomy, TCU Box 298840, Fort Worth, TX 76129 (United States)
Description
We are investigating the extent/existence of PB contributions to the X-ray spectra at 90 deg. to the electron beam for experiments involving 50 keV electrons on Au targets. Our experimental results, for a range of target thicknesses from 63 μg/cm2 to CSDA range of the electrons, are compared to results obtained using the Monte Carlo program, PENELOPE, which is based on ordinary bremsstrahlung. We have reduced the error in target thickness of previous cross section measurements by determining the average target thickness using X-ray absorption
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2007.03.052;
- PII
- S0168-583X(07)00666-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 261
- Journal Issue
- 1-2
- Journal Page Range
- p. 184-188
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 19. International conference on the application of accelerators in research and industry
- Dates
- 20-25 Aug 2006
- Place
- Fort Worth, TX (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39024998
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; BREMSSTRAHLUNG; CROSS SECTIONS; ELECTRON BEAMS; ELECTRONS; ERRORS; KEV RANGE 10-100; MONTE CARLO METHOD; THICKNESS; THIN FILMS; X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; CALCULATION METHODS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; FILMS; IONIZING RADIATIONS; KEV RANGE; LEPTON BEAMS; LEPTONS; PARTICLE BEAMS; RADIATIONS; SORPTION; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.