Published June 2004 | Version v1
Journal article

A new micro-DIGE set-up for the analysis of light elements

Description

The present work shows a relatively simple and inexpensive way of converting the sample chamber of a conventional OM type microprobe into an easily useable micro-DIGE set-up. The basic idea of the set-up is to increase the image distance of the microprobe by moving the focus out of the sample chamber into an extension tube, which is connected to the 0 deg. port of the chamber. This new position of the focus, and so the sample, enables the use of different type of γ-ray detectors in enlarged solid angles increasing the sensitivity of the technique. The degradation of the lateral resolution of the system as a consequence of the increased image distance was theoretically and experimentally investigated. The measured geometric spot size was 15 x 17 μm2. Archaeological and ecological applications of the new set-up are also presented here

Additional details

Identifiers

DOI
10.1016/j.nimb.2004.01.112;
PII
S0168583X04001405;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
219-220
Journal Issue
4
Journal Page Range
p. 508-513
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam analysis
Dates
29 Jun - 4 Jul 2003
Place
Albuquerque, NM (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35084065
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
GAMMA DETECTION; GAMMA RADIATION; GAMMA SPECTROMETERS; IMAGES; ION MICROPROBE ANALYSIS; LIGHT NUCLEI; RESOLUTION; SENSITIVITY; TUBES; USES
Descriptors DEC
CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEI; RADIATION DETECTION; RADIATIONS; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.