A new micro-DIGE set-up for the analysis of light elements
Description
The present work shows a relatively simple and inexpensive way of converting the sample chamber of a conventional OM type microprobe into an easily useable micro-DIGE set-up. The basic idea of the set-up is to increase the image distance of the microprobe by moving the focus out of the sample chamber into an extension tube, which is connected to the 0 deg. port of the chamber. This new position of the focus, and so the sample, enables the use of different type of γ-ray detectors in enlarged solid angles increasing the sensitivity of the technique. The degradation of the lateral resolution of the system as a consequence of the increased image distance was theoretically and experimentally investigated. The measured geometric spot size was 15 x 17 μm2. Archaeological and ecological applications of the new set-up are also presented here
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2004.01.112;
- PII
- S0168583X04001405;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 219-220
- Journal Issue
- 4
- Journal Page Range
- p. 508-513
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 16. international conference on ion beam analysis
- Dates
- 29 Jun - 4 Jul 2003
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35084065
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GAMMA DETECTION; GAMMA RADIATION; GAMMA SPECTROMETERS; IMAGES; ION MICROPROBE ANALYSIS; LIGHT NUCLEI; RESOLUTION; SENSITIVITY; TUBES; USES
- Descriptors DEC
- CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEI; RADIATION DETECTION; RADIATIONS; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.