Published 2006
| Version v1
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High-resolution X-ray diffraction analysis of Pb1-xEuxTe (0.8≤ x≤1.0) epitaxial layers
Creators
- 1. Instituto Nacional de Pesquisas Espaciais (LAS/INPE), Sao Jose dos Campos, SP (Brazil). Lab. Associado de Sensores e Materiais
- 2. Universidade de Sao Paulo (IF/USP), SP (Brazil). Inst. de Fisica
Description
no abstract available
Files
42007359.pdf
Files
(62.2 kB)
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Additional details
Publishing Information
- Imprint Pagination
- [1 p.]
- Report number
- INIS-BR--8492
Conference
- Title
- 29. Brazilian national meeting on condensed matter physics
- Original Conference Title
- 29. Encontro nacional de fisica da materia condensada
- Dates
- 9-13 May 2006
- Place
- Sao Lourenco, MG (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 42007359
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- BRAGG REFLECTION; CRYSTAL GROWTH; CRYSTALLIZATION; CRYSTALLOGRAPHY; DIFFUSE SCATTERING; EPITAXY; EUROPIUM; LAYERS; LEAD; STRUCTURAL CHEMICAL ANALYSIS; TELLURIUM; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; PHASE TRANSFORMATIONS; RADIATIONS; RARE EARTHS; REFLECTION; SCATTERING; SEMIMETALS