Published December 16, 1998 | Version v1
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Structural analysis of a completely amorphous 238Pu-doped zircon by neutron diffraction

Description

The structure of a completely amorphous zircon was determined by time-of-flight neutron diffraction at Argonne's Intense Pulsed Neutron Source (IPNS). The sample of metamict zircon (ZrSiO4),initially doped to 8.85 weight percent 238Pi, had been completely amorphized by alpha-recoil damage since its synthesis in 1981 at the Pacific Northwest National Laboratory (PNNL). The measured diffraction structure factor, S(Q), indicated a completely amorphous sample, with no signs of residual zircon microcrystallinity. The pair distribution function obtained indicated that the structure was that of an oxide glass, retaining the Si-0, Zr-0, and O-O bond lengths of crystalline zircon

Availability note (English)

Available from INIS in electronic form; Also available from OSTI as DE00011025; PURL: https://www.osti.gov/servlets/purl/11025-U2sRfD/webviewable/

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Additional details

Publishing Information

Imprint Pagination
8 p.
Report number
ANL/CMT/CP--96768

Conference

Title
1998 Fall Meeting of the Materials Research Society
Dates
30 Nov - 4 Dec 1998
Place
Boston, MA (United States)

Optional Information

Contract/Grant/Project number
W-31109-ENG-38
Funding organization
US Department of Energy (United States)