Published April 15, 2014
| Version v1
Journal article
The influence of neutron-irradiation at low temperatures on the dielectric parameters of 3C-SiC
- 1. Physics Department, Nelson Mandela Metropolitan University, P.O. Box 77000, Port Elizabeth 6031 (South Africa)
- 2. Fuel Performance and Design Department, Idaho National Laboratory, P.O. Box 1625, Idaho Falls, ID 83415-6188 (United States)
Description
3C-SiC wafers were irradiated with neutrons of various fluences and at low (200–400 °C) irradiation temperatures. Fourier transform infrared (FTIR) reflectance spectra were obtained for the samples, and the spectra used to extract the dielectric parameters for each specimen, using statistical curve-fitting procedures. Analysis of all data revealed trends in reflectance peak heights as well as in the dielectric parameters. The surface roughness of the irradiated samples was measured by atomic force spectroscopy (AFM) and certain trends could be ascribed to surface roughness.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2013.10.059Additional details
Identifiers
- DOI
- 10.1016/j.physb.2013.10.059;
- PII
- S0921-4526(13)00687-X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 439
- Journal Page Range
- p. 169-172
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 5. South African conference on photonic materials
- Acronym
- SACPM 2013
- Dates
- 29 Apr - 3 May 2013
- Place
- Kariega Game Reserve (South Africa)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46019884
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; IRRADIATION; NEUTRONS; PHYSICAL RADIATION EFFECTS; ROUGHNESS; SILICON CARBIDES; SPECTROSCOPY; SURFACES; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- BARYONS; CARBIDES; CARBON COMPOUNDS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; NUCLEONS; PHYSICAL PROPERTIES; RADIATION EFFECTS; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; SURFACE PROPERTIES; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.