Published January 2021 | Version v1
Journal article

Sc-doped NiO nanoflowers sensor with rich oxygen vacancy defects for enhancing VOCs sensing performances

  • 1. University of Science and Technology of China, Hefei, 230026 (China)
  • 2. Anhui Provincial Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, 230031 (China)
  • 3. Key Lab of Photovoltaic and Energy Conservation Materials, Chinese Academy of Sciences, Hefei, 230031 (China)
  • 4. Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei, 230031 (China)

Description

Highlights:• Sc-doped NiO nanoflowers have been synthesized via a facile wet chemical method.• Sc aliovalent dopant could substantially boost the responses of p-type NiO sensor toward VOC molecules.• Other than Ni3+, surface unsaturated oxygen vacancy defects play an important role in facilitating VOC/NiO interfacial charge exchange. -- Abstract: Identifying the defect type which closely correlates with gas/metal oxide semiconductor (MOS) interfacial charge exchange is of utmost importance for rationally designing high performance MOS gas sensors, which are essential for the emerging sensing electronics for assessing the personal health and environment pollution. Herein, we report the sensing performance of p-type NiO toward volatile organic compounds (VOCs) molecules could be drastically improved by Sc dopant. At an optimal doping ratio of 7.4 at.%, the sensor response to 100 ppm acetone was boosted from 8.2 (pure NiO) to 109.4, with a low detection limit of 10 ppb. Comprehensive defect characterizations indicate surface unsaturated oxygen vacancy (VO) defects act as active sites that facilitate the interfacial charge exchange at elevated temperatures. Our work highlights that abundant VO defects induced by aliovalent Sc dopant play an important role in boosting the sensitivity of p-type NiO toward VOCs, and provide valuable guidance in designing high performance p-type MOS sensors.

Additional details

Identifiers

DOI
10.1016/j.jallcom.2020.155760;
PII
S0925838820321241;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
851
Journal Page Range
vp.
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2020 Published by Elsevier B.V.