Published September 2009 | Version v1
Journal article

Fabrication, performance and parasitic parameter extraction of 850 nm high-speed vertical-cavity lasers

  • 1. Electronic Engineering Department, Hijjawi Faculty for Engineering Technology, Yarmouk University, Irbid 21163 (Jordan)
  • 2. Electrical and Computer Engineering Department, Colorado State University, Fort Collins, CO 80526 (United States)

Description

High-speed, oxide-confined, polyimide-planarized 850 nm vertical-cavity surface emitting lasers (VCSELs) with different aperture sizes were fabricated and characterized. Comprehensive small signal measurements and analysis were conducted. The VCSELs exhibit intrinsic, parasitic and thermal maximum bandwidth limitations of 42.3 GHz, 21.5 GHz and 17.6 GHz, respectively. Devices with a 10 µm oxide aperture exhibited a maximum modulation bandwidth of 15.3 GHz, limited by thermal effects, and a modulation current efficiency factor (MCEF) of 9.2 GHz mA−1/2. A VCSEL equivalent circuit model which incorporates the frequency dependence of the polyimide dielectric permittivity and loss is presented. A genetic algorithm (GA) was utilized to extract the parasitic circuit elements from measured microwave reflection coefficients (S11) over a frequency range of 50 MHz to 20 GHz for different device sizes at different bias currents. Good agreement between extracted and calculated parasitic circuit element values was obtained. Several modifications to the device's fabrication steps and structure are suggested to further improve the device's output power and modulation bandwidth

Availability note (English)

Available from http://dx.doi.org/10.1088/0268-1242/24/9/095024

Additional details

Identifiers

DOI
10.1088/0268-1242/24/9/095024;
PII
S0268-1242(09)20263-X;

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
24
Journal Issue
9
Journal Page Range
[8 p.]
ISSN
0268-1242
CODEN
SSTEET