Published December 15, 2007 | Version v1
Journal article

1H NMR electron-nuclear cross relaxation in thin films of hydrogenated amorphous silicon

  • 1. Department of Physics and Engineering Physics, University of Tulsa, Tulsa, Oklahoma 74104 (United States)
  • 2. Department of Physics, University of Utah, Salt Lake City, Utah 84112 (United States)
  • 3. BP Solar, Toano, Virginia 23168 (United States)
  • 4. Department of Physics, Colorado School of Mines, Golden, Colorado 80401 (United States)

Description

We investigate the spin-lattice relaxation of the dipolar order in 1H NMR in hydrogenated amorphous silicon (a-Si:H). We find that the relaxation is dominated by the cross relaxation between the hydrogen nuclei and the paramagnetic states. The relaxation is inhomogeneous, and can be described as a stretched exponential function. We proposed a possible mechanism for this relaxation. This mechanism applies to a rather broad range of paramagnetic states, including the deep neutral defects (dangling bonds), the light-induced metastable defects, the defects created by doping, and the singly occupied, localized band-tail states populated by light at low temperatures. The cross relaxation is only sensitive to the bulk spin density, and the surface spins have a negligible effect on the relaxation

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
76
Journal Issue
24
Journal Page Range
p. 245209-245209.8
ISSN
1098-0121

Optional Information

Notes
(c) 2007 The American Physical Society