A novel patterning effect during high frequency laser micro-cutting of hard ceramics for microelectronics applications
Creators
- 1. STMicroelectronics, 10 rue Thalès de Milet, CS 97155, 37071 Tours Cedex 2 (France)
- 2. GREMI-UMR 7344, CNRS/Univ-Orléans, 14 rue d'Issoudun, BP 6744, F-45067 Orléans (France)
Description
This paper investigates the laser micro-cutting of wide band gap materials for microelectronics industry purposes. An ultraviolet (355 nm) diode-pumped solid-state (DPSS) nanosecond laser was used in this investigation. The laser energy varied from 7 to 140 μJ/pulse with typical frequencies from 40 to 200 kHz. The effect of pulse energy and scanning speed on the depth of the cutting street of α-Al2O3 and glass was studied. Typical depths of 200 μm were achieved on α-Al2O3 for 140 μJ/pulse, 40 kHz at 13 mm/s. SEM images showed periodic patterns produced by periodic explosive boiling that can influence the achieved depth. The shape, size and periodicity of the recast material depended on the feed rate and the laser beam frequency. This periodic removal mechanism seems to be specific to dielectrics since it was not observed for semiconductors such as silicon or silicon carbide.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.02.077Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.02.077;
- PII
- S0169-4332(14)00381-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 302
- Journal Page Range
- p. 163-168
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- E-MRS 2013 symposium V on laser material interactions for micro- and nano-applications
- Dates
- 27-31 May 2013
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023022
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; BEAMS; BOILING; CERAMICS; DIELECTRIC MATERIALS; EXPLOSIONS; EXPLOSIVES; GLASS; INDUSTRY; LASER BEAM MACHINING; LASER RADIATION; MICROELECTRONICS; PERIODICITY; PULSES; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; THERMAL DIFFUSIVITY; ULTRAVIOLET RADIATION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CORUNDUM; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; MACHINING; MATERIALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; RADIATIONS; SILICON COMPOUNDS; THERMODYNAMIC PROPERTIES; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.