Published 1978 | Version v1
Book

Dependence of the anti W-value on the atomic number of heavy ions

  • 1. Brookhaven National Lab., Upton, NY (USA)

Description

Anti W-values (the average energy required to form an ion pair) were determined for 35Cl ions in nitrogen and tissue-equivalent gas. These values were compared with previously reported anti W-values for oxygen ions and alpha particles in the same media. This comparison was made at two specific values of energy per atomic mass unit (u) of the incident ions. At an energy of 2.57 MeV/u, the comparison shows that anti W is 12% and 10% higher for oxygen ions in tissue-equivalent and nitrogen gas, respectively, relative to the alpha particle anti W. At an energy of 0.77 MeV/u, a similar comparison shows that anti W is 20% higher for 35Cl ions and 10% higher for 16O ions in tissue-equivalent gas; and 12% and 10% higher, respectively, in nitrogen gas, relative to the alpha particle anti W. These results indicate that anti W-values depend not only on the energy per atomic mass unit of heavy ions but also on their charge. (author)

Additional details

Publishing Information

Publisher
IAEA.
Imprint Place
Vienna
ISBN
92-0-010578-5
Imprint Title
National and international standardization of radiation dosimetry
Series
Proceedings series.
Journal Page Range
v. 2 p. 65-71.

Conference

Title
International symposium on national and international standardization of radiation dosimetry.
Dates
5 - 9 Dec 1977.
Place
Atlanta, GA, USA.

INIS

Country of Publication
International Atomic Energy Agency (IAEA)
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
11523199
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ALPHA PARTICLES; CHLORINE IONS; DOSIMETRY; EXPERIMENTAL DATA; GRAPHS; IONIZATION CHAMBERS; IONIZATION POTENTIAL; ISOLATED VALUES; OXYGEN IONS
Descriptors DEC
CHARGED PARTICLES; DATA; DATA FORMS; HELIUM IONS; INFORMATION; IONS; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTORS

Optional Information

Secondary number(s)
IAEA-SM--222/02.