Tagging system as a spectrometer of electrons inelastically scattered at small angles
Description
A method for determining the acceptance of a magnetic spectrometer used in an experiment on measurement of the electron inelastic scattering cross section resulting from electrofission of the uranium nuclei, is described. The acceptance is calculated by the Monte Carlo simulation of the experiment with regard to the geometry of the experiment and the electron beam characteristics. The results of calculation are presented in the form of the energy distribution of the probabilities for scattered electron detection by a given channel of the magnetic spectrometer and for the uranium electrofission cross section and the total cross section of hadron photoproduction in the virtual photon energy range Eγ = (0.15-3.55) GeV. 4 refs.; 1 figs.; 2 tabs
Availability note (English)
MF available from INIS under the Report Number.Files
23017399.pdf
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Additional details
Additional titles
- Original title (Russian)
- Использование системы мечения в роли спектрометра для неупругорассеянных электронов под малыми углами
Publishing Information
- Imprint Pagination
- 12 p.
- Report number
- EFI--1174-51-89
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 23017399
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALGORITHMS; BEAM ACCEPTANCE; COMPUTERIZED SIMULATION; ELECTROFISSION; ELECTRON SPECTROMETERS; ELECTRONS; ENERGY DEPENDENCE; HADRONS; INELASTIC SCATTERING; MAGNETIC SPECTROMETERS; MONTE CARLO METHOD; PHOTOPRODUCTION; PROBABILITY; THEORETICAL DATA; TOTAL CROSS SECTIONS; URANIUM ISOTOPES
- Descriptors DEC
- BASIC INTERACTIONS; CROSS SECTIONS; DATA; ELECTROMAGNETIC INTERACTIONS; ELECTRON REACTIONS; ELEMENTARY PARTICLES; FERMIONS; FISSION; INFORMATION; INTERACTIONS; LEPTON REACTIONS; LEPTONS; MEASURING INSTRUMENTS; NUCLEAR REACTIONS; NUMERICAL DATA; PARTICLE INTERACTIONS; PARTICLE PRODUCTION; SCATTERING; SIMULATION; SPECTROMETERS