Published 1990
| Version v1
Miscellaneous
Spectrometer for fine structure detection in ionizing threshold spectroscopy
Creators
- 1. Instituto de Desarrollo Tecnologico para la Industria Quimica, Santa Fe (Argentina)
Description
The design and construction of a spectrometer for the fine structure detection in AEAPS (Auger Electron Appearance Potential Spectroscopy) is described. Details are given in relation to the electron tube design, its power supply and tension-current converter employed for the signal detection. A description of the spectrometer's configuration is given and its performance is analyzed by means of the measurement of polycrystalline iron spectra. (Author)
Abstract (Spanish)
Se describe el diseno y construccion de un espectrometro para la deteccion de la estructura fina en AEAPS (Auger Electron Appearance Potential Spectroscopy). Se dan los detalles correspondientes al diseno del canon de electrones, su fuente de alimentacion y al conversor corriente-tension utilizado para detectar la senal. Se realiza una descripcion de la configuracion del espectrometro y mediante la medicion de espectros de hierro policristalino se analiza su desempeno. (Autor)Additional details
Additional titles
- Original title (Spanish)
- Espectrometro para la deteccion de estructura fina en espectroscopia de umbral de ionizacion
Publishing Information
- Publisher
- Asociacion Fisica Argentina.
- Imprint Place
- Buenos Aires (Argentina)
- Imprint Title
- AFA's annals. V. 1
- Imprint Pagination
- 397 p.
- Journal Page Range
- p. 261-263.
- Report number
- INIS-mf--13205
Conference
- Title
- 74. Meeting of the Argentine Physical Association.
- Original Conference Title
- 74. Reunion de la Asociacion Fisica Argentina
- Dates
- 9-12 Oct 1989.
- Place
- San Luis (Argentina).
INIS
- Country of Publication
- Argentina
- Country of Input or Organization
- Argentina
- INIS RN
- 23049393
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; ENERGY-LEVEL DENSITY; FINE STRUCTURE; IRON; MICROSTRUCTURE; PERFORMANCE; POLYCRYSTALS; SPECIFICATIONS; SPECTROMETERS; SURFACE IONIZATION; SURFACE PROPERTIES; THRESHOLD DETECTORS; THRESHOLD ENERGY
- Descriptors DEC
- CRYSTAL STRUCTURE; CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY; IONIZATION; MEASURING INSTRUMENTS; METALS; NEUTRON DETECTORS; RADIATION DETECTORS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- Imprint:Anales AFA. V. 1.