Published June 21, 2002 | Version v1
Journal article

Comparison of experimental and Monte Carlo simulated BSE spectra of multilayered structures and 'in-depth' measurements in a SEM

  • 1. Department of Physics, Moscow State University, Moscow (Russian Federation)
  • 2. Physikalisches Institut and Interdisziplinaeres Centrum fuer Elektronenmikroskopie und Mikroanalyse (ICEM), Westfaelische Wilhelms Universitaet, Muenster (Germany)

Description

Experimental measurements of the energy distribution of the backscattered electrons (BSE) in a SEM were made with an improved electrostatic toroidal spectrometer and Monte Carlo simulations were used to calculate these BSE spectra. Pure materials, thin films on a substrate and multilayered 'sandwich'-structures were used to record and calculate the energy spectra. The experimental BSE spectra were compared with the results of Monte Carlo simulations. It is shown that from the BSE spectral curves, the depth and thickness of buried films in multilayered structures or of different subsurface inhomogenities can be estimated. The relation between the penetration depth inside the specimen from which the BSE were reflected and the energy of the BSE is given by the Thomson-Whiddington law. The accuracy for the determination of the depth of subsurface layers is generally about 10-20% using appropriate acceleration voltages. (author)

Availability note (English)

Available online at the Web site for the Journal of Physics. D, Applied Physics (ISSN 1361-6463) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
35
Journal Issue
12
Journal Page Range
p. 1433-1437
ISSN
0022-3727

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34000447
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BACKSCATTERING; COMPUTERIZED SIMULATION; ELECTRON BEAMS; ENERGY SPECTRA; LAYERS; MONTE CARLO METHOD; PENETRATION DEPTH; THIN FILMS
Descriptors DEC
BEAMS; CALCULATION METHODS; FILMS; LEPTON BEAMS; PARTICLE BEAMS; SCATTERING; SIMULATION; SPECTRA