Novel temperature compensation technique for force-sensing piezoresistive devices
Creators
- 1. Aerospace and Mechanical Engineering Department, University of Arizona, 1130 N Mountain Ave., Tucson, AZ 85721-0119 (United States)
Description
A novel stress-insensitive piezoresistor in the shape of an annulus has been developed to be used in conjunction with a piezoresistive bridge for temperature-compensated force measurements. Under uniform stress conditions, the annular resistor shows near-zero stress sensitivity and a linear response to temperature excitation within test conditions of 24–34 °C. Annular resistors were placed in close proximity to stress-sensitive elements in order to detect local temperature fluctuations. Experiments evaluating the performance of the temperature compensator while testing force sensitivity showed a thermal rejection ratio of 37.2 dB and near elimination of low-frequency noise (drift) below 0.07 Hz. Potential applications of this annular resistor include use in multi-axis force sensors for force feedback microassembly, improvements in the simplicity and robustness of high precision microgram sensitive balances, higher accuracy for silicon diaphragm-based pressure sensors and simple temperature compensation for AFM cantilevers.
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/21/11/115017Additional details
Identifiers
- DOI
- 10.1088/0960-1317/21/11/115017;
- PII
- S0960-1317(11)91112-7;
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 21
- Journal Issue
- 11
- Journal Page Range
- [8 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46024999
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCURACY; ATOMIC FORCE MICROSCOPY; BALANCES; EXCITATION; FEEDBACK; FLUCTUATIONS; NOISE; PERFORMANCE; PIEZOELECTRICITY; RESISTORS; SENSITIVITY; SENSORS; SILICON; STRESSES
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELECTRICITY; ELEMENTS; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; MEASURING INSTRUMENTS; MICROSCOPY; SEMIMETALS; VARIATIONS; WEIGHT INDICATORS