Published March 2013 | Version v1
Journal article Metadata-only

Evaluation of basic properties of a semiconductor dosimeter in the general radiography

Creators

  • 1. Sapporo Medical Univ., Biomedical Research, Education and Instrumentation Center, Sapporo, Hokkaido (Japan)
  • 2. Sapporo Medical Univ., Hospital, Sapporo, Hokkaido (Japan)

Description

no abstract available

Additional details

Publishing Information

Journal Title
Hokkaido Hoshasen Gijutsu Zasshi
Journal Volume
74
Journal Page Range
p. 60-61
ISSN
0912-0327

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
44090537
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ALUMINIUM; COMPARATIVE EVALUATIONS; DOSEMETERS; ENERGY DEPENDENCE; IONIZATION CHAMBERS; PLATES; SEMICONDUCTOR DEVICES; SENSITIVITY; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; EVALUATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; RADIATIONS