Improving the performance of nickel-coated fluorine-doped tin oxide thin films by magnetic-field-assisted laser annealing
Creators
- 1. Jiangsu Provincial Key Laboratory of Center for Photon Manufacturing Science and Technology, Jiangsu University, Zhenjiang 212013 (China)
- 2. School of Materials Science and Engineering, Jiangsu University, Zhenjiang 212013 (China)
- 3. School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013 (China)
- 4. Jiangsu Tailong Reduction Box Co. Ltd., Taixing 225400 (China)
Description
Highlights: • Ni/FTO films were prepared by sputtering Ni layers on commercial FTO glass. • The as-prepared Ni/FTO films underwent magnetic-field-assisted laser annealing. • Magnetic field and laser fluence were crucial for improving quality of the films. • All Ni/FTO films displayed enhanced compactness after magnetic laser annealing. • Magnetic laser annealing using a fluence of 0.9 J/cm2 led to the best film quality. - Abstract: Nickel-coated fluorine-doped tin oxide (Ni/FTO) thin films were prepared by sputtering Ni layers on commercial FTO glass. The as-prepared Ni/FTO films underwent nanosecond pulsed laser annealing in an external magnetic field (0.4 T). The effects of the presence of magnetic field and laser fluence on surface morphology, crystal structure and photoelectric properties of the films were investigated. All the films displayed enhanced compactness after magnetic-field-assisted laser annealing. It was notable that both crystallinity and grain size of the films gradually increased with increasing laser fluence from 0.6 to 0.9 J/cm2, and then decreased slightly with an increase in laser fluence to 1.1 J/cm2. As a result, the film obtained by magnetic-field-assisted laser annealing using a fluence of 0.9 J/cm2 had the best overall photoelectric property with an average transmittance of 81.2%, a sheet resistance of 5.5 Ω/sq and a figure of merit of 2.27 × 10−2 Ω−1, outperforming that of the film obtained by pure laser annealing using the same fluence
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2015.05.094Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2015.05.094;
- PII
- S0169-4332(15)01213-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 351
- Journal Page Range
- p. 113-118
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47034139
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CRYSTAL STRUCTURE; DOPED MATERIALS; FLUORINE; GLASS; GRAIN SIZE; LASER RADIATION; LAYERS; MAGNETIC FIELDS; MORPHOLOGY; NICKEL; PULSED IRRADIATION; SPUTTERING; SURFACES; THIN FILMS; TIN OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; HALOGENS; HEAT TREATMENTS; IRRADIATION; MATERIALS; METALS; MICROSTRUCTURE; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SIZE; TIN COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.