The ALEPH minivertex detector
Creators
- 1. Max-Planck-Institut fuer Physik und Astrophysik, Muenchen (Germany, F.R.)
- 2. Fraunhofer-Institut fuer Mikroelektronische Schaltungen, Duisburg (Germany, F.R.)
- 3. Scuola Normale Superiore, Pisa (Italy)
- 4. Pisa Univ. (Italy)
- 5. Istituto Nazionale di Fisica Nucleare, Pisa (Italy)
Description
Vertex detectors allow high precision reconstruction of particle tracks and therefore make possible the investigation of the decay topology of short-lived particles in collider experiments. In the ALEPH experiment at LEP a minivertex detector will be installed. It consists of silicon microstrip detectors arranged on two concentric 'cylindrical' surfaces around the interaction point. With this geometry it will be possible to measure the r-φ-z coordinates of particles traversing the detector. The expected position resolution is 10 μm in r-φ and 20 μm in r-z. For optimum signal processing monolithic CMOS readout electronics are under development. Each chip consists of 60 charge sensitive preamplifiers, multiplexed into one output channel. Fast power switching will reduce heat dissipation. Details about construction and expected device performance will be described. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. A
- Journal Volume
- 257
- Journal Issue
- 3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 587-590
- ISSN
- 0168-9002
- CODEN
- NIMAE
Conference
- Title
- 2. topical seminar on perspectives for experimental apparatus at future high energy machines.
- Dates
- 5-9 May 1986.
- Place
- San Miniato (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19005929
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA PROCESSING; GEOMETRY; INTEGRATED CIRCUITS; LEP STORAGE RINGS; MOSFET; MULTIPLEXERS; OPTIMIZATION; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; PREAMPLIFIERS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SPATIAL DISTRIBUTION
- Descriptors DEC
- AMPLIFIERS; DISTRIBUTION; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; FIELD EFFECT TRANSISTORS; MATHEMATICS; MEASURING INSTRUMENTS; MOS TRANSISTORS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; STORAGE RINGS; TRANSISTORS