Development of productive process for long coated conductors by EB evaporation

We have installed original EB evaporation system and verified the performance of CeO2 buffer layers fabricated by EB evaporation method in the YBCO coated conductor in comparison with those fabricated by PLD method. The Ic values of YBCO coated conductors obtained by same deposition for CVD-YBCO were 135 A (EB-CeO2 sample) and 126 A (PLD-CeO2 sample). Though the values of Δφ for the EB-CeO2 layer and PLD-CeO2 layer were different, the Ic values of the YBCO were about the same. This result was shown that the CeO2 layer of Δφ = 10 deg. obtained by EB evaporation was equivalent in performance for YBCO coated conductors to the CeO2 layer of Δφ = 4 deg. obtained by PLD method. The influence of CeO2 film thickness for high speed production was examined. The Ic did not show the remarkable difference with the reduction of CeO2 film thickness. The range of the Ic was only about 20% of the maximum Ic value, regardless of the progress by 5 times in the production speed of CeO2 buffer layers