Published March 2017
| Version v1
Journal article
Electron-induced X-ray intensity ratios of Pb Lα/Lβ and As Kα/Kβ by 18-30 keV applied voltages
Creators
- 1. Kyoto University, Department of Materials Science and Engineering, Kyoto (Japan)
Description
The principal goal of the present study is to evaluate intensity ratios of Pb and As by X-ray analysis. Lead and arsenic overlap and these ratios are important for toxic element analysis. Measurements of Pb-As mixtures were performed using a JEOL JSM-5610LVS scanning electron microscope (SEM-EDX) at 18-30 kV electron voltage and a silicon drift detector (SDD). From overlapped X-ray intensity at 10.5 keV, intensities of As Kα and Pb Lα in mixture were estimated by ratios of Pb Lα/Lβ and As Kα/Kβ in pure elements, and correlation between X-ray intensity and excitation voltage was evaluated. Calculated value was compared with measured intensity. (author)
Additional details
Publishing Information
- Journal Title
- X-sen Bunseki No Shinpo
- Journal Volume
- 48
- Series
- 雑誌名:X線分析の進歩
- Journal Page Range
- p. 346-351
- ISSN
- 0911-7806
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 54097320
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ARSENIC; ELECTRON BEAMS; EXCITATION; LEAD; MULTI-ELEMENT ANALYSIS; PUBLIC HEALTH; SCANNING ELECTRON MICROSCOPY; SI SEMICONDUCTOR DETECTORS; TOXIC MATERIALS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; ENERGY-LEVEL TRANSITIONS; HAZARDOUS MATERIALS; LEPTON BEAMS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 11 refs., 7 figs.