Minimization of composition bias in beta transmission thickness gauges
Creators
Description
The beta-particle intensity transmitted through sheet material exhibits a small but significant variation that depends on composition of the material. This causes errors in on-line thickness gauges when a gauge is used for measurement of a substance having a different composition from that used for calibration. The problem is particularly troublesome in aluminum alloy sheet, where thickness accuracies of better than 0.5% are desired, and many different alloys are measured on a single instrument. First, accurate calibration samples are expensive to produce, validate, and maintain, and only a fraction of the existing aluminum alloys possess adequate suites of well-characterized thickness standards. Second, even within-alloy composition variations (i.e., variations allowed by the composition specification) can result in significant errors, e.g., at least 50 microinches in 11-mil can stock (1 mil = 10-3 in. = 0.00254 cm). If a functional dependence between composition change and thickness error were found, then composition-induced bias could be corrected. Gauge calibration could be updated according to the known composition of alloys (or even individual ingots) for which calibration samples are unavailable
Additional details
Publishing Information
- Journal Title
- Transactions of the American Nuclear Society
- Journal Volume
- 65
- Journal Issue
- 1
- Journal Page Range
- p. 23.
- ISSN
- 0003-018X
- CODEN
- TANSAO
Conference
- Title
- 2. topical meeting on industrial radiation and radioisotope measurement applications.
- Dates
- 8-11 Sep 1992.
- Place
- Raleigh, NC (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24072425
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ALUMINIUM ALLOYS; BETA PARTICLES; CALIBRATION; DATA COVARIANCES; MASS DISTRIBUTION; MATERIALS; OPTIMIZATION; RELIABILITY; THICKNESS GAGES
- Descriptors DEC
- ALLOYS; CHARGED PARTICLES; DISTRIBUTION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS; SPATIAL DISTRIBUTION
Optional Information
- Secondary number(s)
- CONF-920919--.