Published September 1, 1995
| Version v1
Journal article
Charge-density waves and strain waves in thin epitaxial Cr(001) films on Nb
Creators
- 1. Institut fuer Experimentalphysik, Festkoerperphysik, Ruhr-Universitaet Bochum, 44780 Bochum (Germany)
- 2. Brookhaven National Laboratory, Upton, New York 11973 (United States)
Description
We have investigated the magnetic structure of thin epitaxial (001)-oriented Cr films grown on a Nb buffer layer on sapphire. By means of x-ray diffraction measurements the charge density waves (CDW) and strain waves (SW) in Cr film with thicknesses between 500 and 3000 A have been studied. The results show that there exists an orientational pinning effect at both the Cr surface and the interface between Cr and the Nb buffer layer which causes an enlargement of the CDW-SW period, and a single q domain mode having a q vector pointing perpendicular to the surface. This pinning behavior relaxes wth increasing film thickness
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 52
- Journal Issue
- 10
- Journal Page Range
- p. 7363-7368.
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27021184
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE DENSITY; CHROMIUM; COUPLING; DOMAIN STRUCTURE; EPITAXY; INTERFACES; MAGNETISM; NIOBIUM; STRAINS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELEMENTS; FILMS; METALS; SCATTERING; TRANSITION ELEMENTS