Published 1971
| Version v1
Book
Boron implanted contacts on high purity germanium
Creators
Description
no abstract available
Additional details
Publishing Information
- Publisher
- Springer-Verlag New York, Inc.
- Imprint Place
- New York
- Imprint Title
- Ion Implantation in Semiconductors
- Imprint Pagination
- p. 420-429.
Conference
- Title
- 2. international conference on ion implantation in semiconductors.
- Dates
- 24 May 1971.
- Place
- Garmisch-Partenkirchen, Germany.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 3032210
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORON; BULK SEMICONDUCTOR DETECTORS; ELECTRIC CONTACTS; GE SEMICONDUCTOR DETECTORS; GERMANIUM; ION IMPLANTATION
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELEMENTS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS