Published April 1998 | Version v1
Journal article

Estimating gamma fields with an ion chamber operating below saturation

Description

Electronics Division has developed ion chambers with a sensitive volume of 650 cm3 filled with argon gas at 45 psi pressure, an all-welded stainless steel outer envelope and high purity alumina-metal insulators. With a current sensitivity of 0.25 nA r-1 h-1, the chambers can measure gamma exposure dose rates ranging from 10 mr h-1 to 250 r h-1 with an operating voltage of 500 V. Ion chambers of this type have been used earlier to detect failed fuel elements in reactors. Similar chambers have also been used in the wide range gamma monitoring applications and criticality monitoring systems for nuclear fuel storage areas. Tests have been carried out on one of the chambers to study its performance in high gamma fields up to 3000 r h-1. Theoretical calculation of the current sensitivity agrees well with the measured value. The measured values of the chamber current agree well with the theoretically expected values at various applied voltages. By applying 300 V and measuring the current, the chamber can be used to measure unknown exposure rates even under poor saturation conditions with good accuracy

Additional details

Identifiers

PII
S0306454997000571;

Publishing Information

Journal Title
Annals of Nuclear Energy (Oxford)
Journal Volume
25
Journal Issue
6
Journal Page Range
p. 401-407
ISSN
0306-4549
CODEN
ANENDJ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
Malaysia
INIS RN
34039621
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ACCURACY; ARGON; EXPERIMENTAL DATA; GAMMA RADIATION; IONIZATION CHAMBERS; RADIATION DOSES; THEORETICAL DATA
Descriptors DEC
DATA; DOSES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; INFORMATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NONMETALS; NUMERICAL DATA; RADIATION DETECTORS; RADIATIONS; RARE GASES

Optional Information

Copyright
Copyright (c) 1998 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.