Published March 25, 2007 | Version v1
Journal article

Structure of liquid Au-Si alloys around the eutectic region

  • 1. Faculty of Sciences, Kyushu University, Ropponmatsu Fukuoka 810-8560 (Japan)
  • 2. Graduate School of Sciences, Kyushu University, Ropponmatsu Fukuoka 810-8560 (Japan)
  • 3. Japan Synchrotron Radiation Research Institute, 1-1-1 Kouo Mikazuki-cho, Sayou-gun Hyogo 670-5198 (Japan)

Description

X-ray diffraction measurements have been carried out for liquid Au-Si alloys around the eutectic region by the transmission method using high-energy X-ray to investigate the atomic arrangements in the liquid state. From the temperature dependence of the observed structure factors, the partial pair correlation and the detailed atomic arrangements will be discussed on the basis of a Reverse Monte Carlo analysis. The reproduced atomic arrangements around the eutectic region suggest the substitution structure and also rather dense liquid with decreasing temperature

Additional details

Identifiers

DOI
10.1016/j.msea.2006.02.348;
PII
S0921-5093(06)01623-6;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
449-451
Journal Page Range
p. 590-593
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
12. international conference on rapidly quenched and metastable materials
Acronym
RQ12
Dates
21-26 Aug 2005
Place
Jeju (Korea, Republic of)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39037666
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EUTECTICS; GOLD; LIQUID METALS; MONTE CARLO METHOD; SILICON; SILICON ALLOYS; STRUCTURE FACTORS; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELEMENTS; FLUIDS; LIQUIDS; METALS; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.