Design of an area and energy-efficient last-level cache memory using STT-MRAM
- 1. Department of Electronics Engineering, National Institute of Technology-Uttarakhand, Srinagar (Garhwal), Uttarakhand 246174 (India)
- 2. Department of Electronics and Communication Engineering, Hemvati Nandan Bahuguna Garhwal University, Srinagar (Garhwal), Uttarakhand 246174 (India)
Description
This paper presents an area and energy-efficient non-volatile Last-level Cache (LLC) using a STT-MRAM based on a state-of-art perpendicular magnetic tunnel junction (pMTJ) and an Vertical Gate-All-Around Field-Effect Transistor (GAA-FET). This work presented, in this article is carried out from device to circuit, architecture and up to the system level. A detailed analysis of STT-MRAM has been presented by comparing an Vertical GAA-FET (GA) with a bulk-FET (B) at cell level. It is observed that GA-STT-MRAM is advantageous and offers 93.10% and 60% reduction in leakage-power dissipation and area, respectively over B-STT-MRAM. Furthermore, at architecture level, 20% to 80% reduction in sizes of LLCs (ranging from 512 KB to 64 MB) is observed by using GA-STT-MRAM and around 80.78% leakage power reduction is achieved in comparison to SRAM based LLCs. In addition to the architecture level, GA-STT-MRAM is found to have 83.26% and 39.40% energy reduction compared to a B-STT-MRAM and a conventional SRAM, respectively at system level. The GA-STT-MRAM proves to be a more promising candidate to replace conventional semiconductor based LLC for next-generation energy-efficient microprocessors having on-chip non-volatility.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2021.167882Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2021.167882;
- PII
- S030488532100158X;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 529
- Journal Page Range
- vp.
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54042871
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; FIELD EFFECT TRANSISTORS; MAGNETIC TUNNEL JUNCTIONS; MICROPROCESSORS; SEMICONDUCTOR MATERIALS; VOLATILITY
- Descriptors DEC
- ELECTRONIC CIRCUITS; EVALUATION; MATERIALS; MICROELECTRONIC CIRCUITS; SEMICONDUCTOR DEVICES; TRANSISTORS; TUNNEL JUNCTIONS
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.