Photoluminescence properties of Y2SiO5 doped with Eu3+ phosphor
- 1. Bhilai Institute of Technology (Seth Balkrishan Memorial), Near Bhilai House, Durg (India)
- 2. Mahatma Gandhi University, Kottayam, Kerala (India)
Description
The high solid state reaction technique is used to create Y2SiO5 that is doped with Eu3+. The technique is appropriate for mass production. The use of high temperature synthesis procedures can improve luminescence efficiency in several ways. Europium was used in samples at varying concentrations (0.5–1.5 mol%). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) techniques were used to characterize the prepared sample. Scherer's formula determined the particle size to be around 45 nm. The excitation and emission spectra of the photoluminescence with varied concentrations of europium are excellent. Broad peaks at 257 nm with a shoulder peak at 275 nm were discovered in the excitation spectra monitored at 617 nm. The emission spectra were observed at 257 nm and show all visible peaking, with the strongest peak being at 617 nm (red emission). Up to 0.5 mol%, the concentration of europium causes an increase in PL spectrum intensity before a reduction in intensity due to concentration quenching. The Commission Internationale de I'Eclairage (CIE) approach was used to determine the spectrophotometric determination. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Brazilian Journal of Physics (Online)
- Journal Volume
- 53
- Journal Issue
- 4
- Journal Page Range
- 1 p.
- ISSN
- 1678-4448
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 54059491
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DOPED MATERIALS; EMISSION SPECTRA; EUROPIUM IONS; EXCITATION; PARTICLE SIZE; PHOTOLUMINESCENCE; SPECTROPHOTOMETRY; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM SILICATES
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; ENERGY-LEVEL TRANSITIONS; IONS; LUMINESCENCE; MATERIALS; MICROSCOPY; OXYGEN COMPOUNDS; PHOTON EMISSION; SCATTERING; SILICATES; SILICON COMPOUNDS; SIZE; SPECTRA; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS