Published April 2005 | Version v1
Journal article

Electrodeposition of low residual stress CoNiMnP hard magnetic thin films for magnetic MEMS actuators

  • 1. Department of Mechanical Engineering, University of Minnesota-Twin Cities, Minneapolis, MN 55455 (United States)
  • 2. Institut fuer Robotik und Intelligente Systeme (IRIS), Swiss Federal Institute of Technology (ETH), Zurich (Switzerland)

Description

A new technique for electrodeposition of CoNiMnP hard magnetic thin films is developed to provide thin films with low residual stress and magnetic properties useful for MEMS applications. Processing parameters including applied current density, film thickness, pH and temperature of the electrolyte are regulated in order to reduce residual stress of the film. In addition, a hybrid residual stress reliever composed of sodium saccharine and a rare-earth salts mixture of Ce2(SO4)3 and Nd2(SO4)3 is created to further reduce the residual stress, eliminate microcracks and improve surface morphology of the film. The effects of residual stress on the magnetic properties of electrodeposited CoNiMnP hard magnetic films such as coercivity, saturation and residual magnetization are reported in this paper

Additional details

Identifiers

DOI
10.1016/j.jmmm.2004.10.094;
PII
S0304-8853(04)01184-9;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
292
Journal Page Range
p. 49-58
ISSN
0304-8853
CODEN
JMMMDC

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.