Published August 1988
| Version v1
Journal article
Electron defect formation by NiO a thermostimulated exoemission excitation
Creators
Description
Experimental data on the excitation of thermostimulated exoelectron emission within 50-500 eV energy range are presented. It is shown, that the formation of electron defects occurs at elastic scattering distortion near the capture centers
Additional details
Additional titles
- Original title (Russian)
- Формирование электронных дефектов при возбуждении термостимулированной экзоэмиссии NiO
Publishing Information
- Journal Title
- Izvestiya Vysshikh Uchebnykh Zavedenij, Fizika
- Journal Volume
- 52
- Journal Issue
- 8
- Series
- Izv. Vyssh. Uchebn. Zaved., Fiz.
- Journal Page Range
- 1609-1610
- ISSN
- 0021-3411
- CODEN
- IVUFA
Conference
- Title
- 20. All-Union conference on emission electronics.
- Dates
- Nov 1987.
- Place
- Kiev (Ukrainian SSR).
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 20053871
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CROSS SECTIONS; CRYSTALS; ELASTIC SCATTERING; ELECTRON BEAMS; ELECTRON EMISSION; EV RANGE 10-100; EV RANGE 100-1000; HIGH TEMPERATURE; NICKEL OXIDES; STIMULATED EMISSION; TEMPERATURE DEPENDENCE; THRESHOLD ENERGY; TRAPS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; EMISSION; ENERGY; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; EV RANGE; LEPTON BEAMS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; SCATTERING; TRANSITION ELEMENT COMPOUNDS