Published November 1999
| Version v1
Journal article
Comparison of microwave and mutual inductance measurements of the inductive nonlinearity of HTS thin films
- 1. Naval Research Laboratory, Washington, DC 20375-5343 (United States)
- 2. National Institute of Standards and Technology, Boulder, CO 80303 (United States)
Description
A quadratic dependence of penetration depth on supercurrent density may be observed both by an inductive measurement on unpatterned films and by a microwave measurement of third-harmonic generation in coplanar waveguide. Results for the two methods are compared for a series of YBCO films. We find good agreement between the two measurements. (author)
Additional details
Publishing Information
- Journal Title
- Superconductor Science and Technology (Online)
- Journal Volume
- 12
- Journal Issue
- 11
- Journal Page Range
- p. 714-716
- ISSN
- 1361-6668
Conference
- Title
- International superconductive electronics conference
- Dates
- 21-25 Jun 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 31041550
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; HIGH-TC SUPERCONDUCTORS; INDUCTANCE; MEASURING METHODS; MICROWAVE EQUIPMENT; PENETRATION DEPTH; THIN FILMS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; PHYSICAL PROPERTIES; SUPERCONDUCTORS; TYPE-II SUPERCONDUCTORS