Kondo-lattice behaviour of CeNi9Si4
Description
We have studied the crystal chemistry, thermodynamic and transport properties of ternary compounds RNi9Si4 with R=La and Ce. The Rietveld refinement of the X-ray diffraction pattern revealed a tetragonal crystal structure (space group I4/mcm) that is derived from the cubic NaZn13 structure type. In the case of CeNi9Si4 resistivity, magnetic susceptibility and specific heat measurements reveal Kondo-lattice behaviour with a T2 temperature dependence of the electrical resistivity, an enhanced Pauli susceptibility χ0=5x10-3 emu/mol and a Sommerfeld value γ=155 (5) mJ/mol K2. The magnetic susceptibility and specific heat contribution is well described by the Coqblin-Schrieffer model with a fully degenerate J=5/2 ground state and a characteristic temperature T0≅180 K. LaNi9Si4 exhibits simple Pauli paramagnetic, metallic behaviour with a Sommerfeld value γ=33 mJ/mol K2
Additional details
Identifiers
- DOI
- 10.1016/S0921-4526(02)02448-1;
- arXiv
- arXiv:math/0411079v3;
- PII
- S0921452602024481;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 329-333
- Journal Issue
- 1-2
- Journal Page Range
- p. 572-573
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36094244
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CERIUM; CRYSTALS; ELECTRIC CONDUCTIVITY; GROUND STATES; INTERMETALLIC COMPOUNDS; KONDO EFFECT; MAGNETIC SUSCEPTIBILITY; NICKEL; PARAMAGNETISM; SILICON; SPECIFIC HEAT; TEMPERATURE DEPENDENCE; TETRAGONAL LATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY LEVELS; MAGNETIC PROPERTIES; MAGNETISM; METALS; PHYSICAL PROPERTIES; RARE EARTHS; SCATTERING; SEMIMETALS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.