Secondary particle identification using the relativistic rise in ionization
Creators
- Toothacker, W.S.1
- Trumpinski, S.1
- Whitmore, J.2
- Lewis, R.A.2
- Gress, J.3
- Ammar, R.3
- Coppage, D.3
- Davis, R.3
- Kanekal, S.3
- Kwak, N.3
- Elcombe, P.A.4
- Hill, J.C.4
- Neale, W.W.4
- Kowald, W.5
- Robertson, W.J.5
- Walker, W.D.5
- Lucas, P.6
- Voyvodic, L.6
- Bishop, J.M.7
- Biswas, N.N.7
- Cason, N.M.7
- Kenney, V.P.7
- Mattingly, M.C.K.7
- Ruchti, R.C.7
- Shephard, W.D.7
- Ting, S.J.Y.7
- 1. Pennsylvania State Univ., Mont Alto (USA)
- 2. Pennsylvania State Univ., University Park (USA). Dept. of Physics
- 3. Kansas Univ., Lawrence (USA)
- 4. Cambridge Univ. (UK)
- 5. Duke Univ., Durham, NC (USA)
- 6. Fermi National Accelerator Lab., Batavia, IL (USA)
- 7. Notre Dame Univ., IN (USA)
Description
We report on the data analysis and techniques used to determine particle identification from the relativistic rise in ionization as detected by CRISIS, a 1 x 1 x 3 m3, 192 cell, ionization-sampling drift chamber containing an 80% argon/20% carbon dioxide gas mixture. For 100 GeV/c protons/antiprotons (pions) we obtain an ionization FWHM of 7.6% (7.9%), which compares well with the design value of 7.8%. The separation between the mean ionization values for the protons and pions was determined to be 7.9%. We also present the analysis of particle identification for secondary particles produced by interactions in the bubble chamber. A statistical method for correcting for the overlapping ionization curves from secondary protons/antiprotons and pions is discussed. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A
- Journal Volume
- 273
- Journal Issue
- 1
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 97-107
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 20023508
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANTIPROTON REACTIONS; ANTIPROTONS; ARGON; BINARY MIXTURES; BUBBLE CHAMBERS; CALIBRATION; CARBON DIOXIDE; CORRECTIONS; COUNTING TECHNIQUES; DRIFT CHAMBERS; ENERGY DEPENDENCE; GEV RANGE 01-10; GEV RANGE 10-100; IONIZATION; PARTICLE DISCRIMINATION; PARTICLE IDENTIFICATION; PARTICLE PRODUCTION; PARTICLE TRACKS; PION DETECTION; PION MINUS REACTIONS; PION PLUS REACTIONS; PIONS MINUS; PIONS PLUS; PROTON DETECTION; PROTON REACTIONS; PROTONS; RELATIVISTIC RANGE; SILVER 107 TARGET; SILVER 109 TARGET; STATISTICS
- Descriptors DEC
- ANTIBARYONS; ANTIMATTER; ANTINUCLEI; ANTINUCLEON REACTIONS; ANTINUCLEONS; ANTIPARTICLES; BARYON REACTIONS; BARYONS; BOSONS; CARBON COMPOUNDS; CARBON OXIDES; CATIONS; CHALCOGENIDES; CHARGED PARTICLE DETECTION; CHARGED PARTICLES; DETECTION; DISPERSIONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; GAS TRACK DETECTORS; GEV RANGE; HADRON REACTIONS; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONS; MATHEMATICS; MATTER; MEASURING INSTRUMENTS; MESON REACTIONS; MESONS; MIXTURES; MULTIWIRE PROPORTIONAL CHAMBER; NONMETALS; NUCLEAR REACTIONS; NUCLEI; NUCLEON REACTIONS; NUCLEONS; OXIDES; OXYGEN COMPOUNDS; PION REACTIONS; PIONS; PROPORTIONAL COUNTERS; PSEUDOSCALAR MESONS; RADIATION DETECTION; RADIATION DETECTORS; RARE GASES; TARGETS