Observation of the temporal evolution of an unstable macroscopic quantum system with a nanoseconds resolution
- 1. Department of Physics and Astronomy, University of Kansas, Lawrence, KS (United States)
- 2. Kansai Advance Research Center, Communication Research Laboratory, Ministry of Posts and Telecommunications, Iwaoka-cho, Nishi-Ku, Kobe (Japan)
Description
High-resolution (sub-microsecond to nanosecond) time-resolved measurements of the dynamics of superconducting electronic devices, such as Josephson tunnel junctions and SQUIDs, are indispensable for fundamental physics research, such as quantum mechanics of macroscopic variables. We describe the development of a time-resolved measurement technique that enables direct measurements, in the time domain, of the temporal evolution of Josephson junctions with a nanosecond resolution. The technique was applied to study escape dynamics of Josephson junctions, as macroscopic quantum systems, in the quantum tunnelling regime. The measured probability of junctions remaining in the initial metastable state - the survival probability - as a function of time decayed exponentially, agrees very well with the theoretical prediction of the incoherent tunnelling process. (author)
Availability note (English)
Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/Additional details
Identifiers
- URL
- http://www.iop.org/;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 15
- Journal Issue
- 4
- Journal Page Range
- p. 555-558
- ISSN
- 0953-2048
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33014792
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- JOSEPHSON JUNCTIONS; QUANTUM MECHANICS; SQUID DEVICES; TIME RESOLUTION; TUNNEL EFFECT
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MECHANICS; MICROWAVE EQUIPMENT; RESOLUTION; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS; TIMING PROPERTIES