Published May 2003
| Version v1
Journal article
Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions
Creators
Description
The absolute electron-impact ionization cross section of Sc+ ions was measured by employing the crossed beams technique. We find pronounced contributions (up to ∼30%) of indirect processes to the total ionization cross section. This finding is related to the existence of exceptionally strong 3p→3d excitation channels in Sc+(3p63d4s)
Additional details
Identifiers
- PII
- S0168583X02020438;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 410-412
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077488
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUTOIONIZATION; COLLIDING BEAMS; CROSS SECTIONS; ELECTRON BEAMS; ELECTRONIC STRUCTURE; EXCITATION; IONIZATION; SCANDIUM IONS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ENERGY-LEVEL TRANSITIONS; IONIZATION; IONS; LEPTON BEAMS; PARTICLE BEAMS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.