Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model

In order to acquire the life information of organic light emitting diode (OLED), three groups of constant stress accelerated degradation tests are performed to obtain the luminance decaying data of samples under the condition that the luminance and the current are respectively selected as the indicator of performance degradation and the test stress. Weibull function is applied to describe the relationship between luminance decaying and time, least square method (LSM) is employed to calculate the shape parameter and scale parameter, and the life prediction of OLED is achieved. The numerical results indicate that the accelerated degradation test and the luminance decaying model reveal the luminance decaying law of OLED. The luminance decaying formula fits the test data very well, and the average error of fitting value compared with the test data is small. Furthermore, the accuracy of the OLED life predicted by luminance decaying model is high, which enable rapid estimation of OLED life and provide significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life. - Highlights: • We gain luminance decaying data by accelerated degradation tests on OLED. • The luminance decaying model objectively reveals the decaying law of OLED luminance. • The least square method (LSM) is employed to calculate Weibull parameters. • The plan designed for accelerated degradation tests proves to be feasible. • The accuracy of the OLED life and the luminance decaying fitting formula is high