Published 1983 | Version v1
Miscellaneous

Orientation-dependent yields of characteristic X-ray emission from bombardment of Au single crystals by S ions

Description

We have measured the S-K and Au-M X-ray yield for the system 45 MeV Ssup(q+) (q =13-15) on the <111> axis of a thin monocrystalline Au target (500 A). A strongly enhanced (factor 5) S-K X-ray yield is observed for q = 15+ in the channeling direction compared to the random direction and to the yields with lower projectile charge states. The target M X-ray yield depends on the crystal orientation too. The data are interpreted by a model using orientation-dependent cross sections for K vacancy production, decay and electron transfer. (orig.)

Availability note (English)

Available from Max-Planck-Institut fuer Kernphysik, Heidelberg (Germany, F.R.).

Additional details

Additional titles

Original title (German)
Orientierungsabhaengige Ausbeuten charakteristischer Roentgenstrahlung beim Beschuss eines Au-Einkristalls mit hochgeladenen S-Ionen

Publishing Information

Imprint Title
Max-Planck-Institut fuer Kernphysik. Annual report 1983
Imprint Pagination
223 p.
Journal Page Range
p. 127-128.

Optional Information

Notes
Imprint:Max-Planck-Institut fuer Kernphysik. Jahresbericht 1983.