Sample shape and temperature strongly influence the yield strength of metallic nanopillars
Creators
- 1. Department of Materials Science and Engineering, Johns Hopkins University, 102 Maryland Hall, 3400 N. Charles Street, Baltimore, MD 21218 (United States)
Description
For bulk face-centered cubic metals in conventional tests, the effects of sample shape on the yield stress are negligibly small, and the strength dependence on temperature is very weak. Using molecular dynamics simulations, here we demonstrate marked differences in yield stress for Cu pillars with different cross-sectional geometries, or tested at different temperatures, when the sample dimensions are on the nanometer scale. The origin of this change in yield behavior from conventional bulk Cu is explained by analyzing dislocation emission from the surfaces and corners as the mechanism to mediate plasticity. Based on a systematic characterization of the surface structure, atomic-level stresses and strains, a local strain criterion is proposed for yielding in such nanoscale objects
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2008.05.044Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2008.05.044;
- PII
- S1359-6454(08)00405-9;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 56
- Journal Issue
- 17
- Journal Page Range
- p. 4816-4828
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011155
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DISLOCATIONS; FCC LATTICES; MOLECULAR DYNAMICS METHOD; NANOSTRUCTURES; PLASTICITY; SIMULATION; STRAINS; STRESSES; SURFACES; TEMPERATURE DEPENDENCE; YIELD STRENGTH
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; LINE DEFECTS; MECHANICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.