Orbital single particle tracking on a commercial confocal microscope using piezoelectric stage feedback
Creators
- 1. Laboratory for Fluorescence Dynamics, Department of Biomedical Engineering, University of California, Irvine, CA 92697 (United States)
Description
Single Particle Tracking (SPT) is a technique used to locate fluorescent particles with nanometer precision. In the orbital tracking method the position of a particle is obtained analyzing the distribution of intensity along a circular orbit scanned around the particle. In combination with an active feedback this method allows tracking of particles in 2D and 3D with millisecond temporal resolution. Here we describe a SPT setup based on a feedback approach implemented with minimal modification of a commercially available confocal laser scanning microscope, the Zeiss LSM 510, in combination with an external piezoelectric stage scanner. The commercial microscope offers the advantage of a user-friendly software interface and pre-calibrated hardware components. The use of an external piezo-scanner allows the addition of feedback into the system but also represents a limitation in terms of its mechanical response. We describe in detail this implementation of the orbital tracking method and discuss advantages and limitations. As an example of application to live cell experiments we perform the 3D tracking of acidic vesicles in live polarized epithelial cells. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2050-6120/2/2/024010Additional details
Identifiers
Publishing Information
- Journal Title
- Methods and Applications in Fluorescence
- Journal Volume
- 2
- Journal Issue
- 2
- Journal Page Range
- [9 p.]
- ISSN
- 2050-6120
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47061573
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ACCURACY; COMPUTER CODES; DISTRIBUTION; FEEDBACK; FLUORESCENCE; LASERS; MICROSCOPES; MODIFICATIONS; PARTICLES; PIEZOELECTRICITY; RESOLUTION; THREE-DIMENSIONAL CALCULATIONS; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ELECTRICITY; EMISSION; LUMINESCENCE; PHOTON EMISSION