Published 1985
| Version v1
Miscellaneous
XRF analysis of geological samples: optimization of parameters to improve speed and accuracy
Description
Abstract only
Additional details
Publishing Information
- Imprint Place
- Pretoria (South Africa)
- ISBN
- 0 7988 2371 2
- Imprint Title
- Second international symposium on analytical chemistry in the exploration, mining and processing of materials
- Imprint Pagination
- 348 p.
- Journal Page Range
- p. 321.
Conference
- Title
- 2. International symposium on analytical chemistry in the exploration, mining and processing of materials.
- Dates
- 15-19 Apr 1985.
- Place
- Pretoria (South Africa).
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 20001621
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- ACCURACY; GEOLOGY; OPTIMIZATION; SAMPLE PREPARATION; VELOCITY; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS