Published August 1, 2014 | Version v1
Journal article

Experimental setup for Single Event Effects at the São Paulo 8UD Pelletron Accelerator

  • 1. Instituto de Física da Universidade de São Paulo, São Paulo, SP (Brazil)
  • 2. Centro Universitário da FEI, São Bernardo do Campo, SP (Brazil)
  • 3. Centro de Tecnologia da Informação Renato Archer, Campinas, SP (Brazil)

Description

In this work we present an experimental setup mounted in one of the beam lines at the São Paulo 8UD Pelletron Accelerator in order to study Single Event Effects in electronic devices. The basic idea is to use elastic scattering collisions to achieve a low-flux with a high-uniformity ion beam to irradiate several devices. 12C, 16O, 28Si, 35Cl and 63Cu beams were used to test the experimental setup. In this system it is possible to use efficiently LET values of 17 MeV/mg/cm2 for an external beam arrangement and up to 32 MeV/mg/cm2 for in-vacuum irradiation

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2014.02.105

Additional details

Identifiers

DOI
10.1016/j.nimb.2014.02.105;
PII
S0168-583X(14)00362-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
332
Journal Page Range
p. 397-400
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
21. international conference on ion beam analysis
Dates
23-28 Jun 2013
Place
Seattle, WA (United States)

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.