Modeling pulse characteristics in Xenon with NEST
Creators
- 1. Department of Physics, University of California, One Shields Avenue, Davis, CA 95616 (United States)
- 2. Department of Physics, University of Washington, Box 351560, Seattle, WA 98195-1560 (United States)
- 3. Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA, 94551 (United States)
Description
A comprehensive model for describing the characteristics of pulsed signals, generated by particle interactions in xenon detectors, is presented. An emphasis is laid on two-phase time projection chambers, but the models presented are also applicable to single phase detectors. In order to simulate the pulse shape due to primary scintillation light, the effects of the ratio of singlet and triplet dimer state populations, as well as their corresponding decay times, and the recombination time are incorporated into the model. In a two phase time projection chamber, when simulating the pulse caused by electroluminescence light, the ionization electron mean free path in gas, the drift velocity, singlet and triplet decay times, diffusion constants, and the electron trapping time, have been implemented. This modeling has been incorporated into a complete software package, which realistically simulates the expected pulse shapes for these types of detectors
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/9/04/T04002Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 9
- Journal Issue
- 04
- Journal Page Range
- p. T04002
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46055959
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIFFUSION; ELECTROLUMINESCENCE; MEAN FREE PATH; PARTICLE DECAY; PARTICLE INTERACTIONS; PULSE SHAPERS; PULSES; SCINTILLATIONS; SIGNALS; SIMULATION; TIME PROJECTION CHAMBERS; TRIPLETS; XENON
- Descriptors DEC
- DECAY; DRIFT CHAMBERS; ELECTRONIC CIRCUITS; ELEMENTS; EMISSION; FLUIDS; GASES; INTERACTIONS; LUMINESCENCE; MEASURING INSTRUMENTS; MULTIPLETS; MULTIWIRE PROPORTIONAL CHAMBERS; NONMETALS; PHOTON EMISSION; PROPORTIONAL COUNTERS; PULSE CIRCUITS; RADIATION DETECTORS; RARE GASES; SIGNAL CONDITIONERS