Published October 1, 2013 | Version v1
Journal article

Effect of the ZnS shell layer on the charge storage capabilities of organic bistable memory devices fabricated utilizing CuInS2–ZnS core–shell quantum dots embedded in a poly(methylmethacrylate) layer

  • 1. Department of Nanoscale Semiconductor Engineering, Hanyang University, Seoul 133-791 (Korea, Republic of)
  • 2. Department of Molecular Science and Technology, Ajou University, Suwon 443-749 (Korea, Republic of)

Description

The electrical characteristics of organic bistable memory devices (OBDs) fabricated utilizing CuInS2 (CIS) core or CIS–ZnS core–shell quantum dots (QDs) embedded in a poly(methylmethacrylate) (PMMA) layer on indium–tin-oxide (ITO) coated glass substrates were investigated. X-ray photoelectron spectroscopy spectra demonstrated that the stoichiometries of the QDs embedded in a PMMA layer were CIS or CIS–ZnS QDs. Current–voltage measurements on Al/CIS or CIS–ZnS QDs embedded in PMMA layer/ITO glass devices at 300 K showed current bistabilities. The maximum ON/OFF current ratios of the OBDs with CIS or CIS–ZnS QDs were approximately 1 × 103 and 1 × 105, respectively. The retention number of ON and OFF states was measured by 1 × 105. The memory mechanisms of the OBDs with CIS or CIS–ZnS QDs are described on the basis of the experimental results. - Highlights: • Organic bistable devices utilizing nanocomposites were fabricated. • Current–voltage results on organic bistable devices showed current bistabilities. • Maximum ON/OFF current ratio of the device with core–shell quantum dots was 1 × 105. • Retention number of the device with core–shell quantum dots was 1 × 105

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.02.086

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.02.086;
PII
S0040-6090(13)00356-8;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
544
Journal Page Range
p. 433-436
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. international conference on technological advances of thin films and surface coatings
Dates
14-17 Jul 2012
Place
Singapore (Singapore)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.