Numerical computation method for fluorescence absolute measurement with semiconductor detector

A method based on basic parameters, for semi-conductor detector with circle surface to acquire absolute fluorescence count and curve of relationship between the count and sample thickness, is developed by analytical geometry and integral of angle. The relative deviation between the measured copper fluorescence count with different thickness and the result of theory is 6.21% at most. The theoretical curve coincides with measurement results, which proves that the theoretical calculated curve of the relationship between fluorescence count and sample thickness is useful in thickness measurement based on absolute fluorescence measurement. (authors)