Superconducting and semiconducting thin films of La123 and their superlattices
- 1. North Carolina State Univ., Raleigh, NC (United States). Dept. of Materials Science and Engineering
- 2. Oak Ridge National Lab., TN (United States). Solid State Div.
Description
Thin films of La123 and their superlattice with Y123 are deposited on various substrates for the first time. Thin films of La123 can be made semiconducting or superconducting within a small range of oxygen stoichiometry. A multiple target holder has been used for insitu processing of superlattice thin films. The ability of the La123 compound to exhibit either semiconductivity or superconductivity has been utilized to construct semiconductor/superconductor superlattice structures with Y123 X-ray diffraction studies have shown clearly the presence of two distinct type of layers in the superlattice films with a individual layer thickness of ∼120 and 300 Angstrom, although this did not happen for ∼24 Angstrom thickness of the individual layers. Rutherford backscattering experiments showed good quality of the films with channeling yields <10%. Resistivity measurements showed a Tc (onset) = 90 K and Tc(zero) = 85 K for the La123 as well as superlattice thin films
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-057-7
- Imprint Title
- High-temperature superconductors: Fundamental properties and novel materials processing
- Imprint Pagination
- 1322 p.
- Journal Page Range
- p. 561-564.
Conference
- Title
- Materials Research Society fall meeting.
- Dates
- 27 Nov - 2 Dec 1989.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23041886
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM OXIDES; COPPER OXIDES; DEPOSITION; ELECTRIC CONDUCTIVITY; IN-SITU PROCESSING; LANTHANUM OXIDES; LAYERS; RUTHERFORD SCATTERING; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; SUPERCONDUCTIVITY; SUPERLATTICES; THIN FILMS; TRANSITION TEMPERATURE; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELASTIC SCATTERING; ELECTRICAL PROPERTIES; FILMS; LANTHANUM COMPOUNDS; MATERIALS; ORE PROCESSING; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; SCATTERING; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Funding organization
- National Science Foundation, Washington, DC (United States).
- Secondary number(s)
- CONF-891119--.