Published March 2009 | Version v1
Report Metadata-only

Average charge and its orientation dependence of MeV C2+ fragment ions exiting thin carbon foil

Creators

  • 1. Japan Atomic Energy Agency, Takasaki Advanced Radiation Research Inst., Takasaki, Gunma (Japan)
  • 2. Japan Atomic Energy Agency, Advanced Science Research Center, Takasaki, Gunma (Japan)
  • 3. Okayama Univ., Dept. of Applied Physics, Okayama (Japan)

Description

no abstract available

Part of:
Proceedings of the 21st meeting for tandem accelerators and their associated technologies

Additional details

Publishing Information

Imprint Title
Proceedings of the 21st meeting for tandem accelerators and their associated technologies
Imprint Pagination
180 p.
Journal Page Range
p. 84-86
Report number
JAEA-Conf--2008-012

Conference

Title
21. meeting for tandem accelerators and their associated technologies
Dates
31 Jul - 1 Aug 2008
Place
Takasaki, Gunma (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41053085
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
CAMERAS; CARBON IONS; CHARGE DISTRIBUTION; CHARGE STATES; CHARGE-COUPLED DEVICES; CLUSTER BEAM INJECTION; COULOMB FIELD; DISSOCIATION; ENERGY LOSSES; EXCITED STATES; FOILS; FULLERENES; INCIDENCE ANGLE; MEV RANGE 01-10; MOLECULAR IONS; MULTI-CHANNEL ANALYZERS; MULTIPLE COLLISION METHOD; ORIENTATION; TANDEM ELECTROSTATIC ACCELERATORS
Descriptors DEC
ACCELERATORS; BEAM INJECTION; CALCULATION METHODS; CARBON; CHARGED PARTICLES; ELECTRIC FIELDS; ELECTRONIC EQUIPMENT; ELECTROSTATIC ACCELERATORS; ELEMENTS; ENERGY LEVELS; ENERGY RANGE; EQUIPMENT; IONS; LOSSES; MEV RANGE; NONMETALS; PULSE ANALYZERS; SEMICONDUCTOR DEVICES

Optional Information

Notes
2 refs., 5 figs., 1 tab.