Published October 1, 2005 | Version v1
Journal article

Effect of inclined magnetic field on pinning parameters in YBaCuO thin films with columnar defects

  • 1. Faculty of Engineering, Kumamoto University, 2-39-1 Kurokami, Kumamoto 860-8555 (Japan)
  • 2. Kumamoto Industrial Research Institute, 3-11-8 Higashi-machi, Kumamoto 862-0901 (Japan)
  • 3. Japan Atomic Energy Research Institute (JAERI), Tokai-mura, Ibaraki 319-1195 (Japan)

Description

The effect of inclined magnetic field on pinning parameters in YBCO thin films with columnar defects was investigated. The columnar defects were produced by the heavy-ion irradiation with 200 MeV Xe ions parallel to c-axis. The magnetic field was applied inclined to c-axis with angle θ B which was 0 deg. , 10 deg. , and 20 deg. . One of the pinning parameters z, which is also called the dynamic critical exponent, extremely increased near the certain field related to the density of columnar defects in the case of θ B = 0 deg. , that is, a peak in the magnetic field dependence of z appeared near B/B φ = 1/3, while such peak was not observed before irradiation. On the other hand, the peak did not appear and the values of z decreased with the tilting angle θ B. According to the percolation model, the appearance of the peak of z near B/B φ = 1/3 for θ B 0 deg. originates from the matching effect. When the magnetic field is inclined away from columnar defects, the vortices are not pinned along those defects so that the matching effect is not achieved and the columnar defects take the various values of pinning force to flux lines

Additional details

Identifiers

DOI
10.1016/j.physc.2005.02.023;
PII
S0921-4534(05)00222-4;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
426-431
Journal Page Range
p. 83-87
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
17. International symposium on superconductivity - Advances in superconductivity XVII
Acronym
ISS 2004
Dates
23-25 Nov 2004
Place
Niigata (Japan)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.