Study of magnetization reversal processes in a thin Co film
Creators
- 1. School of Physical Sciences, National Institute of Science Education and Research (NISER), IOP Campus, Bhubaneswar-751005 (India)
Description
The magnetization reversal has been studied both along the easy- and hard- axes for an in plane magnetized thin Cobalt film using magneto-optical Kerr effect (MOKE) microscope. We observe that magnetization reversal is governed by domain wall motion accompanied by nucleation when measured along the easy axis. However coherent rotation is observed during magnetization reversal when measured along the hard axis. The relaxation of magnetization in constant dc magnetic field measured along the easy axis shows exponential behaviour which according to Fatuzzo–Labrune model indicates domain nucleated dominant process. Domain wall velocity plotted as a function of constant dc magnetic field shows creep and slide regime from which the depinning transition was extracted. - Highlights: ► Kerr microscopy was performed for different field orientation to the easy axis. ► Here we have measured domain wall velocity in constant dc fields. ► Creep, depinning and slide modes of domain wall motion have been observed. ► Magnetic relaxation data can be very well fitted to Fatuzzo–Labrune model. ► Magnetization reversal occurs via domain nucleation and wall motion
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2013.02.009Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2013.02.009;
- PII
- S0304-8853(13)00091-7;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 336
- Journal Page Range
- p. 20-25
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45100722
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COBALT; CREEP; KERR EFFECT; MAGNETIC FIELDS; MAGNETIZATION; MICROSCOPY; NUCLEATION; RELAXATION; THIN FILMS
- Descriptors DEC
- DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MECHANICAL PROPERTIES; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.